QT-3104 QG gate charge test

Third generation

Semiconductor Testing

family

Third generation semiconductor testing family

Home Product Test System Power Device Testing System

MENU

IC testing system

QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)

QT-8200 PLUS Digital-Analog Hybrid IC Test System (Hard-Docking)

QT-8600RF Mixed Signal RF Test System
Power module and device testing system

QT-8400D power device multi-site test system

QT-8400GaN Gallium Nitride Test System

QT-8409PIM high-power dynamic and static comprehensive test system

QT-8409IPM Intelligent Power Module Test System
Discrete devices high-speed testing system

QT-6000 Discrete Device High-Speed Test System
Power Device Testing System

QT-4100 power device test system

KGD (Know Good Die) testing solution

QT-DRM101000 GaN Dynamic RDON

QT-3108 SW IGBT/SiC dynamic test

QT-3104 QG gate charge test

QT-3101 UIL avalanche test

QT-3102 thermal resistance tester

QT-3107 LCR RG/CG test

QT-3105 TRR diode reverse recovery test

QT-3104 QG gate charge test

QT-3104 QG meets the tiny QG value test of SiC devices.

Support double DIE

Overload and undervoltage protection

High precision testing

Support extension

Model	QT-3104 QG
Product Advantages	Meets the tiny QG value test of SiC devices
Key Features	• Test capability: 200A/150V 150A/1000V

Recommended products

QT-4100 power device test system

QT-4100 power device test system

KGD (Know Good Die) testing solution

KGD (Know Good Die) testing solution

QT-DRM101000 GaN Dynamic RDON

QT-DRM101000 GaN Dynamic RDON

QT-3108 SW IGBT/SiC dynamic test

QT-3108 SW IGBT/SiC dynamic test

QT-3101 UIL avalanche test

QT-3101 UIL avalanche test