QT-3104 QG gate charge test

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QT-3104 QG gate charge test

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QT-3104 QG gate charge test

QT-3104 QG meets the tiny QG value test of SiC devices.

Support double DIE

Overload and undervoltage protection

High precision testing

Support extension

Model	QT-3104 QG
Product Advantages	Meets the tiny QG value test of SiC devices
Key Features	• Test capability: 200A/150V 150A/1000V

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