KGD (Know Good Die) testing solution

Third generation

Semiconductor Testing

family

Third generation semiconductor testing family

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IC testing system

QT-8100 Digital-Analog Hybrid IC Test System (Cable-Mount)

QT-8200 PLUS Digital-Analog Hybrid IC Test System (Hard-Docking)

QT-8600RF Mixed Signal RF Test System
Power module and device testing system

QT-8400D power device multi-site test system

QT-8400GaN Gallium Nitride Test System

QT-8409PIM high-power dynamic and static comprehensive test system

QT-8409IPM Intelligent Power Module Test System
Discrete devices high-speed testing system

QT-6000 Discrete Device High-Speed Test System
Power Device Testing System

QT-4100 power device test system

KGD (Know Good Die) testing solution

QT-DRM101000 GaN Dynamic RDON

QT-3108 SW IGBT/SiC dynamic test

QT-3104 QG gate charge test

QT-3101 UIL avalanche test

QT-3102 thermal resistance tester

QT-3107 LCR RG/CG test

QT-3105 TRR diode reverse recovery test

KGD (Know Good Die) testing solution

Supports high temperature and normal temperature testing: DC+SW+UIL+DC&RG; Support testing pin card protection scheme; Provide a complete set of testing + sorting solutions;

Pin card

protection

Two-DUT test in parallel

High temperature and

normal temperature

Data merge

Model	KGD testing solutions
Product Advantages	• Low spurious solutions; • Exclusive pin card protection patented technology; • Overload and undervoltage protection; • Test two wafers at a time; • Supports high temperature heating

Recommended products

QT-4100 power device test system

QT-4100 power device test system

QT-DRM101000 GaN Dynamic RDON

QT-DRM101000 GaN Dynamic RDON

QT-3108 SW IGBT/SiC dynamic test

QT-3108 SW IGBT/SiC dynamic test

QT-3104 QG gate charge test

QT-3104 QG gate charge test

QT-3101 UIL avalanche test

QT-3101 UIL avalanche test