Third generation

Semiconductor Testing

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Third generation semiconductor testing family
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KGD (Know Good Die) testing solution

Sustain high temperature and normal temperature testing: DC+SW+UIL+RG&QA; Provide test machine + turret/translation sorting machine matching solution; Provide short circuit protection + self-developed probe



Pin card 

protection

  

Two-DUT test in parallel

High temperature and 

normal temperature

Data merge

Model KGD testing solutions
Product Advantages Low stray solution
Short circuit protection: short circuit shutdown time is less than 300nS
Customized socket, adapt to different Handler solutions

Special probe material, short circuit test does not melt or stick to foreign matter

Support station merging

Support test machine + turret solution, high test efficiency