Prober

Third generation

Semiconductor Testing

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Third generation semiconductor testing family

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Prober

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Prober

Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading. Fully automatic CCD visual n

Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model	Prober
Product introduction	Suitable for automatic probe testing of wafers such as 6 and 8″ Si and SiC discrete devices, power devices, integrated circuits, radio frequency devices, optical chips, etc. Automatic loading and unloading, Wafer ID reading.
Features	• Fully automatic CCD visual needle positioning. • High-precision positioning platform. • Support normal high temperature testing. • Generate Mapping display Bin in real time. • Universal GPIB, TTL, R-232 interface.

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