Third generation
Semiconductor Testing
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Third generation semiconductor testing family
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QT-3105 TRR diode reverse recovery test
Self-developed LCR digital bridge supports Mosfet RG/CG test and can also be used to test the capacitance of diodes, with a resolution of 1fF
Independent programmable power supply |
Support double DIE |
Dual channel test |
Waveform display |
Type | QT-3105TRR |
Advantages | Supports dual-core TRR parameter testing, equipped with VRR voltage probe |
Main Features |
• Output capability IF 100A VR 1KV di/dt>1000A Measurement resolution 0.1ns |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
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