Third generation
Semiconductor Testing
family
Third generation semiconductor testing family
MENU


QT-8600RF Mixed Signal RF Test System
RF6G/12G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, and spurious test.
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
Model | QT-8600RF Mixed Signal RF Test System |
Product Advantages | RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test |
Key Features |
• 6GHz/12GHz RF measurement, digital meets tests MIPI 100MHz or within • Supports vector scalar test, DC, digital, RF integrated machine • Power up to 9GHz & 35dBm, supports 2-station RF parallel test, multi-station composite test • Self-developed algorithm communication, UPH up to 12K/H • Provides efficient test platform for RF switches, LNA, TUNER, filters and other devices |
![]() |
No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
![]() |
+86 757 83207313 (Sales) |
![]() |
+86 757 83208786 (Sales) |
![]() |
info@powertechsemi.com |
Copyright PowerTECH industrial Co., Ltd. Powertechsmemi.com © 2015 | Privacy policy | Sitmap 粤ICP备17127080号-1


