Third generation
Semiconductor Testing
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Third generation semiconductor testing family
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QT-8600RF Mixed Signal RF Test System
RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test
Suspended power supply |
Multiple sites in parallel |
Multi-channel high precision |
Supports multiple extensions |
Model | QT-8600RF Mixed Signal RF Test System |
Product Advantages | RF6G test module, used for high power output, harmonic test, switching time, insertion loss, isolation, S11, Ron, Coff, same-end loop, IP3, spurious test |
Key Features |
• DC, digital, RF integrated machine • 16 RF ports (8 in & 8 out) • 6Ghz RF measurement circuit, power can be configured to 48dBm • Self-developed RF source board and algorithm, UPH improves by more than 90% compared with traditional ones • Supports vector and scalar testing • Digital meets MIPI 50Mhz or above test • Supports 2-station RF parallel testing and multi-station composite testing • Provide a cost-effective test platform for RF switches, LNA, TUNER, filters and other devices. |
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No. 16 Guangming Avenue, New Light Source Industry Base, Nanhai National High tech Zone, Foshan City, Guangdong Province, China |
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+86 757 83207313 (Sales) |
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+86 757 83208786 (Sales) |
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info@powertechsemi.com |
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