KGD handler

Third generation

Semiconductor Testing

family

Third generation semiconductor testing family

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KGD handler

Prober

Module sorting machine

Double loading fully automatic marking machine

Gravity double track sorting machine

KGD handler

Suspended power supply

Multiple sites in parallel

Multi-channel high precision

Supports multiple extensions

Model	KGD handler
Product introduction	Fully automatic testing, supporting SiC wafer, Waffle Pack, Tape&Reel loading and unloading.
Features	• Multi-station parallel testing, different stations support different temperatures and test items. • Static, dynamic, avalanche function testing, and the test sequence is adjustable. • High temperature preheating and chip surface anti-oxidation protection. • High temperature test, temperature range: room temperature~200°C. • The power-on pin card is sealed and supports nitrogen filling to protect against high-pressure sparks and nitrogen pressure monitoring.

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